Leading experts from federal agencies, industry, and academia will be invited to discuss pressing technical issues at a panel session on November 1.
“SiC MOSFET Reliability and Ruggedness: present status and future directions”
Moderator: Victor Veliadis
Aivars Lelis, ARL
Anant Agarwal, OSU
Brian Peaslee, GM
Don Gajewski, Wolfspeed
Subhashish Bhattacharya, NCSU
“Ask the Experts: GaN Reliability /Qualification Q and A”
What is recent progress and any challenges remaining for GaN Reliability and Product Qualification? This open panel will take your questions.
Moderator: Tim McDonald, Chair of JEDEC JC 70.1, PSMA Board of Directors, Chair of PowerAmerica Membership advisory committee and consultant to Infineon
Jaume Roig, ON Semi
Kenichiro Tanaka, Panasonic
Ron Barr, Transphorm
Sameh Khalil, Infineon Technologies
Sandeep Bahl, TI