Panel Session

Leading experts from federal agencies, industry, and academia will be invited to discuss pressing technical issues at a panel session on November 1.

“SiC MOSFET Reliability and Ruggedness: present status and future directions”

Moderator: Victor Veliadis


Aivars Lelis, ARL

Anant Agarwal, OSU

Brian Peaslee, GM

Don Gajewski, Wolfspeed

Subhashish Bhattacharya, NCSU


“Ask the Experts: GaN Reliability /Qualification Q and A”

What is recent progress and any challenges remaining for GaN Reliability and Product Qualification? This open panel will take your questions.

Moderator: Tim McDonald, Chair of JEDEC JC 70.1, PSMA Board of Directors, Chair of PowerAmerica Membership advisory committee and consultant to Infineon


Jaume Roig, ON Semi

Kenichiro Tanaka, Panasonic

Ron Barr, Transphorm

Sameh Khalil, Infineon Technologies

Sandeep Bahl, TI