Panel Session
Leading experts from federal agencies, industry, and academia will be invited to discuss pressing technical issues at a panel session on November 1.
“SiC MOSFET Reliability and Ruggedness: present status and future directions”
Moderator: Victor Veliadis
Panelists:
Aivars Lelis, ARL
Anant Agarwal, OSU
Brian Peaslee, GM
Don Gajewski, Wolfspeed
Subhashish Bhattacharya, NCSU
“Ask the Experts: GaN Reliability /Qualification Q and A”
What is recent progress and any challenges remaining for GaN Reliability and Product Qualification? This open panel will take your questions.
Moderator: Tim McDonald, Chair of JEDEC JC 70.1, PSMA Board of Directors, Chair of PowerAmerica Membership advisory committee and consultant to Infineon
Panelists:
Jaume Roig, ON Semi
Kenichiro Tanaka, Panasonic
Ron Barr, Transphorm
Sameh Khalil, Infineon Technologies
Sandeep Bahl, TI