Panel Session

Leading experts from federal agencies, industry, and academia will be invited to discuss pressing technical issues at a panel session on November 1.

“SiC MOSFET Reliability and Ruggedness: present status and future directions”

Moderator: Victor Veliadis

Panelists:

Aivars Lelis, ARL

Anant Agarwal, OSU

Brian Peaslee, GM

Don Gajewski, Wolfspeed

Subhashish Bhattacharya, NCSU

 

“Ask the Experts: GaN Reliability /Qualification Q and A”

What is recent progress and any challenges remaining for GaN Reliability and Product Qualification? This open panel will take your questions.

Moderator: Tim McDonald, Chair of JEDEC JC 70.1, PSMA Board of Directors, Chair of PowerAmerica Membership advisory committee and consultant to Infineon

Panelists:

Jaume Roig, ON Semi

Kenichiro Tanaka, Panasonic

Ron Barr, Transphorm

Sameh Khalil, Infineon Technologies

Sandeep Bahl, TI